Robert Manion, General Manager for Semiconductor Solutions at NI, discusses the evolving role of reliability, quality, and failure analysis in the semiconductor industry. He emphasizes the importance of automation and AI in accelerating testing processes and improving data insights. Mannion highlights the need for enhanced collaboration and data sharing between failure analysis and manufacturing labs to improve device reliability and yield. He also addresses the challenges presented by new wide bandgap semiconductors and the importance of developing standards and methodologies to ensure their long-term performance.