Hardware engineers often encounter the performance verification bottleneck. The bottleneck occurs at the final step of every printed circuit board design. If there is no simulation and measurement workflow to quickly validate designs and identify signal integrity issues before the final verification, you are not maximizing your team’s productivity. This presentation demonstrates an intuitive simulation and measurement workflow to maximize your PCB design productivity. Three case studies of PCIe channel will provide fixes to common signal integrity problems. The problems addressed are related to controlled impedance, return loss and insertion loss. The presentation closes with multi-domain analysis on an example PCIe channel. Analyses such as mixed-mode S-parameters, eye diagram, time domain reflectometry (TDR) are crucial in troubleshooting SI issues.
If you are new to signal integrity, this session will give you a head start on your signal integrity journey. For experienced hardware engineers, this presentation is an excellent refresher on the fundamental SI analyses and concepts in both simulation and measurement.
Who is this for?
New hardware engineers will learn how to fix three common cases of signal integrity problems. Experienced hardware engineers will have a good refresher on their signal integrity basics. Both will learn to create an optimized simulation and measurement design cycle within their team.
About Tim Wang Lee Ph.D
Chun-ting “Tim” Wang Lee, Ph.D. is a Signal Integrity Application Scientist in the PathWave Software and Solutions group of Keysight Technologies. Tim received his Ph.D. in Electrical Engineering from the University of Colorado at Boulder in 2020. His work focuses on understanding the printed circuit board fabrication process and how it impacts the on-board Signal Integrity. Lately, he has been presenting ways to improve simulation and measurement correlation. Tim has garnered much acclaim for his well-crafted presentations and memorable delivery style.
About Mike Resso
Mike Resso is the Signal Integrity Application Scientist in the Internet Infrastructure Solution Group of Keysight Technologies and has over thirty years of experience in the test and measurement industry. His background includes the design and development of electro-optic test instrumentation for aerospace and commercial applications. His most recent activity has focused on the complete multiport characterization of high-speed digital interconnects using Time Domain Reflectometry and Vector Network Analysis. He has authored over 30 professional publications including two books on signal integrity. Mike has been awarded one US patent and has twice received the Agilent “Spark of Insight” Award for his contribution to the company. He received a Bachelor of Science degree in Electrical and Computer Engineering from University of California.
Visit Keysight's website:
www.keysight.com/us/en/home.html
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